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U.S. President Barack Obama speaks during a ceremony to honor the U.S. Women's National Soccer Team and their victory in the 2015 FIFA Women's World Cup at the East Room of the White House in Washington D.C. Ryan O'Reilly Jersey , Oct. 27, 2015. (XinhuaYin Bogu) U.S. President Barack Obama poses for group photos with members of the U.S. Women's National Soccer Team during a ceremony to honor them and their victory in the 2015 FIFA Women's World Cup at the East Room of the White House in Washington D.C., Oct. 27, 2015. (XinhuaYin Bogu) U.S. President Barack m and their victory in the 2015 FIFA Women's World Cup at the East Room of the White House in Washington D.C., Oct. 27 David Perron Jersey , 2015. (XinhuaYin Bogu) U.S. President Barack Obama speaks during a ceremony to honor the U.S. Women's National Soccer Team and their victory in the 2015 FIFA Women's World Cup at the East Room of the White House in Washington D.C., Oct. 27, 2015. (XinhuaYin Bogu) Members of the U.S. Women's National Soccer Team take photos from the balcony of White House as U.S. President Barack Obama leaves, after a ceremony to honor them and their victory in the 2015 FIFA Women's World Cup at the East Room of the White House in Washington D.C., Oct. 27, 2015. (XinhuaYin Bogu)
WASHINGTON, Oct. 27 (Xinhua) -- President Barack Obama on Tuesday welcomed the U.S. Women's National Soccer Team to the White House Colton Parayko Jersey , to honor their victory in the 2015 FIFA Women's World Cup.


"These champions deserve all the attention that they've been getting. After 16 long years, too many heartbreaks, they flew north to put America back on top of the soccer world and they did it in style," Obama said.


"This team taught all of America's children that 'playing like a girl' means you're a badass," said Obama, who received a special jersey bearing the number 44 from head coach Jill Ellis, as Obama is the 44th president of the United States.


The U.S. beat Japan 5-2 in t ment Type (Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Focused Ion Beam System (FIB) and Dual-beam Systems), By Technology (Focused Ion Beam (FIB) Technology Alex Pietrangelo Jersey , Broad Ion Milling (BIM) Technology, Secondary Ion Mass Spectroscopy (SIMS) Technology, Energy Dispersive X-ray Spectroscopy (EDX) Technology, Reactive Ion Etching (RIE) Technology and Chemical Mechanical Planarization (CMP) Technology), By Application (Industrial Science, Material Science, Bioscience and Electronics)) - Growth Dmitrij Jaskin Jersey , Future Prospects and Competitive Landscape, 2018 鈥?2026鈥? the global failure analysis equipment market is expected to witness a growth of 8.3% CAGR during the forecast period from 2018 to 2026.


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The global failure analysis equipment market was valued at US$ 4,978.4 Mn in 2017, expanding at a CAGR of 8.3% during the forecast period from 2018 to 2026. Failure analysis is import